
Conditionnement et tests permettant d'accroître la valeur ajoutée des semi-conducteurs
Description
Introduction au livre
Ce livre est une introduction au conditionnement et aux tests des semi-conducteurs.
Le chapitre 1 décrit l'équipement et le processus de test, ainsi que les éléments de test généraux, et le chapitre 2 explique la définition et le rôle du package, les tendances de développement technologique et le processus de développement technologique.
Le chapitre 3 classe les types d'emballages et décrit les caractéristiques, les avantages et les inconvénients de chaque type.
Le chapitre 4 explique la conception et l'analyse des boîtiers, en soulignant les différences entre la conception des boîtiers et la conception des puces, et en présentant le contenu et le processus de l'analyse structurelle, thermique et électrique pour améliorer l'efficacité de la conception et du processus.
Le chapitre 5 explique le processus d'emballage, en présentant la séquence du processus par type ainsi que le déroulement et la signification de chaque étape.
Le chapitre 6 présente les matériaux utilisés dans le processus d'emballage, et le chapitre 7 explique la signification de la qualité et de la fiabilité, ainsi que les méthodes et les objectifs des éléments d'évaluation de la fiabilité.
Le chapitre 1 décrit l'équipement et le processus de test, ainsi que les éléments de test généraux, et le chapitre 2 explique la définition et le rôle du package, les tendances de développement technologique et le processus de développement technologique.
Le chapitre 3 classe les types d'emballages et décrit les caractéristiques, les avantages et les inconvénients de chaque type.
Le chapitre 4 explique la conception et l'analyse des boîtiers, en soulignant les différences entre la conception des boîtiers et la conception des puces, et en présentant le contenu et le processus de l'analyse structurelle, thermique et électrique pour améliorer l'efficacité de la conception et du processus.
Le chapitre 5 explique le processus d'emballage, en présentant la séquence du processus par type ainsi que le déroulement et la signification de chaque étape.
Le chapitre 6 présente les matériaux utilisés dans le processus d'emballage, et le chapitre 7 explique la signification de la qualité et de la fiabilité, ainsi que les méthodes et les objectifs des éléments d'évaluation de la fiabilité.
indice
01 Semiconducteur
Comprendre le test
01.
Post-traitement des semi-conducteurs ················································································ 5
02.
Types de tests· ...
03.
Tests sur plaquettes ········································································ 10
EPM ·· ...
Rodage de la plaquette················································································ 13
Test ·························································································· 14
Réparation· ...
04.
Tests d'emballage ······································································· 16
TDBI · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · 17
Test ························································································· 18
Inspection visuelle························································································ 18
02 Semiconducteur
Définition et rôle des paquets
01.
Définition du boîtier semi-conducteur····························································· 25
02.
Le rôle des boîtiers de semi-conducteurs ············································ 26
03.
Tendances en matière de développement des boîtiers de semi-conducteurs··············· 28
04.
Processus de développement des boîtiers de semi-conducteurs ········································ 31
03 Semiconducteur
Type d'emballage
01.
Classification des boîtiers de semi-conducteurs· ...
02.
Emballage conventionnel····································································41
Boîtiers en plastique - Boîtiers de type cadre de connexion···························41
Emballages plastiques - Emballages de type substrat ··················· 43
Emballage en céramique ·· ...
03.
Conditionnement au niveau de la plaquette····················································································· 47
Conditionnement au niveau de la plaquette ················································································· 47
Recâblage· ...
Flip Chips ·· ...
04.
Emballage plastifié· ...
Empilage de colis ············································································ 67
Empilage de puces - Empilage de puces avec liaison filaire··············· 70
Interconnexion traversante en silicium (TSV) - Empilement de puces avec TSV ··············· 73
05.
Système dans l'emballage· ...
04 Semiconducteur
Conception et analyse des emballages
01.
Conception de boîtiers pour semi-conducteurs ·················································································· 97
02.
Analyse structurale· ...
Analyse de la flexion· ...
Fiabilité des joints de soudure ··············································································· 106
Analyse des forces· ...
03.
Analyse thermique ·· ...
04.
Interprétation électrique ········································································113
05 Semiconducteur
processus d'emballage
01.
Procédé d'emballage conventionnel·························································123
Retouche arrière ·····················································124
Découpe de plaquettes······················································127
Fixation de la matrice ···································································131
Interconnexion·····································································137
Moulage·····················································································143
Marquage·································································144
Élagage - Cadre de connexion··························································146
Placage de soudure - Cadre de connexion······································147
Moulage - Cadre de connexion···························································147
Montage par billes de soudure - Substrat ························148
Singulation - Substrat ················152
02.
Procédé d'encapsulation au niveau de la plaquette···················································153
Procédé photographique ·······································································156
Procédé de pulvérisation cathodique ···················································· 161
Procédé de galvanoplastie ··················································163
Procédé humide - Bande PR et gravure métallique ····················166
Processus WLCSP avec ventilateur···························································167
Procédé de montage des billes de soudure·············································168
Procédé de micro-boîtier Flip Chip ··························································169
Processus de recâblage ·································································171
Processus WLCSP de diffusion··························································172
Procédé d'encapsulation de silicium à travers les électrodes··············· 174
03.
Inspection et mesure·······················································187
Inspection································································187
Mesure···················································································192
06 Semiconducteur
Matériaux d'emballage
01.
Matériaux d'emballage conventionnels························································ 208
Cadre conducteur ········································································· 208
Substrat· ...
Adhésif· ...
Composé de moulage époxy························································ 222
Soudure ························································································· 225
Bande· ...
Fil ····················································································· 229
Matériaux d'emballage ············································································ 230
02.
Matériaux d'encapsulation au niveau de la plaquette····································································· 231
Photorésine ·························································································· 231
Solution de placage··············································································· 234
RP Stripper······································································· 235
Agent· ...
Cible de pulvérisation cathodique ········································································ 238
Sous-remplissage· ...
Supports, adhésifs et rubans de montage·········································· 240
07 Semiconducteur
fiabilité de l'emballage
01.
Signification de la fiabilité ·· ...
02. Normes JEDEC ·· ...
03.
Tests de fiabilité en cours de vie· ...
EFR ······ · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · 253
HTOL ···························································· ····························································· 254
LTOL ·· ...
HTSL ·· ...
LTSL···················································· 257
Endurance ·· ...
Conservation des données············································································ 258
04.
Essais de fiabilité environnementale···································································· 259
Préconditionnement································································ 259
TC ·· ...
TS ·· ...
THS·························································································· 268
PCTP · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · 269
UHAST ·························································· ·························································· 270
HAST························································································· 271
HALT········································································ 272
05.
Essais de fiabilité mécanique············································ 273
Choc.................................................................................274
Vibration· ...
Flexion ·································································· 275
Twist·················································································276
08 Semiconducteur
Glossaire
Glossaire des termes············································································ 282
Comprendre le test
01.
Post-traitement des semi-conducteurs ················································································ 5
02.
Types de tests· ...
03.
Tests sur plaquettes ········································································ 10
EPM ·· ...
Rodage de la plaquette················································································ 13
Test ·························································································· 14
Réparation· ...
04.
Tests d'emballage ······································································· 16
TDBI · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · 17
Test ························································································· 18
Inspection visuelle························································································ 18
02 Semiconducteur
Définition et rôle des paquets
01.
Définition du boîtier semi-conducteur····························································· 25
02.
Le rôle des boîtiers de semi-conducteurs ············································ 26
03.
Tendances en matière de développement des boîtiers de semi-conducteurs··············· 28
04.
Processus de développement des boîtiers de semi-conducteurs ········································ 31
03 Semiconducteur
Type d'emballage
01.
Classification des boîtiers de semi-conducteurs· ...
02.
Emballage conventionnel····································································41
Boîtiers en plastique - Boîtiers de type cadre de connexion···························41
Emballages plastiques - Emballages de type substrat ··················· 43
Emballage en céramique ·· ...
03.
Conditionnement au niveau de la plaquette····················································································· 47
Conditionnement au niveau de la plaquette ················································································· 47
Recâblage· ...
Flip Chips ·· ...
04.
Emballage plastifié· ...
Empilage de colis ············································································ 67
Empilage de puces - Empilage de puces avec liaison filaire··············· 70
Interconnexion traversante en silicium (TSV) - Empilement de puces avec TSV ··············· 73
05.
Système dans l'emballage· ...
04 Semiconducteur
Conception et analyse des emballages
01.
Conception de boîtiers pour semi-conducteurs ·················································································· 97
02.
Analyse structurale· ...
Analyse de la flexion· ...
Fiabilité des joints de soudure ··············································································· 106
Analyse des forces· ...
03.
Analyse thermique ·· ...
04.
Interprétation électrique ········································································113
05 Semiconducteur
processus d'emballage
01.
Procédé d'emballage conventionnel·························································123
Retouche arrière ·····················································124
Découpe de plaquettes······················································127
Fixation de la matrice ···································································131
Interconnexion·····································································137
Moulage·····················································································143
Marquage·································································144
Élagage - Cadre de connexion··························································146
Placage de soudure - Cadre de connexion······································147
Moulage - Cadre de connexion···························································147
Montage par billes de soudure - Substrat ························148
Singulation - Substrat ················152
02.
Procédé d'encapsulation au niveau de la plaquette···················································153
Procédé photographique ·······································································156
Procédé de pulvérisation cathodique ···················································· 161
Procédé de galvanoplastie ··················································163
Procédé humide - Bande PR et gravure métallique ····················166
Processus WLCSP avec ventilateur···························································167
Procédé de montage des billes de soudure·············································168
Procédé de micro-boîtier Flip Chip ··························································169
Processus de recâblage ·································································171
Processus WLCSP de diffusion··························································172
Procédé d'encapsulation de silicium à travers les électrodes··············· 174
03.
Inspection et mesure·······················································187
Inspection································································187
Mesure···················································································192
06 Semiconducteur
Matériaux d'emballage
01.
Matériaux d'emballage conventionnels························································ 208
Cadre conducteur ········································································· 208
Substrat· ...
Adhésif· ...
Composé de moulage époxy························································ 222
Soudure ························································································· 225
Bande· ...
Fil ····················································································· 229
Matériaux d'emballage ············································································ 230
02.
Matériaux d'encapsulation au niveau de la plaquette····································································· 231
Photorésine ·························································································· 231
Solution de placage··············································································· 234
RP Stripper······································································· 235
Agent· ...
Cible de pulvérisation cathodique ········································································ 238
Sous-remplissage· ...
Supports, adhésifs et rubans de montage·········································· 240
07 Semiconducteur
fiabilité de l'emballage
01.
Signification de la fiabilité ·· ...
02. Normes JEDEC ·· ...
03.
Tests de fiabilité en cours de vie· ...
EFR ······ · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · 253
HTOL ···························································· ····························································· 254
LTOL ·· ...
HTSL ·· ...
LTSL···················································· 257
Endurance ·· ...
Conservation des données············································································ 258
04.
Essais de fiabilité environnementale···································································· 259
Préconditionnement································································ 259
TC ·· ...
TS ·· ...
THS·························································································· 268
PCTP · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · · 269
UHAST ·························································· ·························································· 270
HAST························································································· 271
HALT········································································ 272
05.
Essais de fiabilité mécanique············································ 273
Choc.................................................................................274
Vibration· ...
Flexion ·································································· 275
Twist·················································································276
08 Semiconducteur
Glossaire
Glossaire des termes············································································ 282
SPÉCIFICATIONS DES PRODUITS
- Date de publication : 10 mars 2020
Nombre de pages, poids, dimensions : 332 pages | 914 g | 178 × 245 × 30 mm
- ISBN13 : 9791156858577
- ISBN10 : 1156858577
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